Transit-time measurements of charge carriers in disordered silicons: Amorphous, microcrystalline and porous

Author: Schiff E. A.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.89, Iss.28-30, 2009-10, pp. : 2505-2518

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract