Time resolved microwave conductivity measurements for the characterization of transport properties in thin film micro-crystalline silicon

Author: Vanderhaghen R.   Brenot R.   Drevillon B.   Roca i Cabarrocas P.   French I.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.296, Iss.1, 1997-03, pp. : 94-97

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Abstract