Structural studies of parasexiphenyl thin films: Importance of the deposition parameters

Author: Athouel L.   Froyer G.   Riou M.T.   Schott M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.274, Iss.1, 1996-03, pp. : 35-45

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract