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Taylor & Francis Ltd

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Compositions of different phases appearing during devitrification of Zr 46.75 Ti 8.25 Cu 7.5 Ni 10 Be 27.5 bulk metallic glass

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UHV RHEED system for in-situ studies of sputtered films

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Effect of process parameter changes on the composition of magnetron sputtered and evaporated TiN and AlN films measured by UHV in-situ techniques

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Formation of icosahedral quasicrystals in an annealed Zr 65 Al 7.5 Ni 10 Cu 12.5 Ag 5 metallic glass

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