An interference method for the determination of thin film anisotropy

Author: Surdutovich G.I.   Kolenda J.   Fragalli J.F.   Misoguti L.   Vitlina R.   Baranauskas V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.279, Iss.1, 1996-06, pp. : 119-123

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract