A new method for the determination of the channel length reduction in polysilicon thin film transistors (TFTs)

Author: Farmakis F.V.   Brini J.   Kamarinos G.   Mathieu N.   Dimitriadis C.A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.337, Iss.1, 1999-01, pp. : 105-108

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Abstract