Author: Malhotra A.K. Yalisove S.M. Bilello J.C.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.286, Iss.1, 1996-09, pp. : 196-202
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Fractal patterns in Au-Ta multilayer films upon ion beam mixing
Philosophical Magazine Letters, Vol. 91, Iss. 3, 2011-03 ,pp. :
Optical characterization of porous silicon films and multilayer filters
Applied Physics A, Vol. 79, Iss. 8, 2004-12 ,pp. :
X-ray multilayer optics: growth and characterization
By Lodha G.S. Raghuvanshi V.K. Modi M.H. Tripathi P. Verma A. Nandedkar R.V.
Vacuum, Vol. 60, Iss. 4, 2001-03 ,pp. :