X-ray reflectivity analysis of thin TiN and TiO x N y films deposited by dual-ion-beam sputtering on (100)Si substrates

By Alvisi M.   Rizzo A.   Tapfer L.   Vasanelli L.  

Thin Solid Films, Vol. 298, Iss. 1, 1997-04 ,pp. : 130-134

Elsevier

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Mechanical properties of nanoscaled TiC/Fe multilayers deposited by ion beam sputtering technique

By Wang J.   Li W.-Z.   Li H.-D.  

Thin Solid Films, Vol. 382, Iss. 1, 2001-02 ,pp. : 190-193

Elsevier

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Microstructural study of iron nitride thin films deposited by ion beam sputtering

By Gupta M.   Gupta A.   Chaudhari S.M.   Phase D.M.   Ganesan V.   Rama Rao M.V.   Shripathi T.   Dasannacharya B.A.  

Vacuum, Vol. 60, Iss. 4, 2001-03 ,pp. : 395-399

Elsevier

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Angular distribution of rare gas atoms trapped in thin films deposited by ion beam sputtering of an YBa 2 Cu 3 O 7-x target

By Benayoun S.   Gaboriaud R.J.  

Thin Solid Films, Vol. 265, Iss. 1, 1995-09 ,pp. : 29-32

Elsevier

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Growth and nanostructure of InN thin films deposited by reactive magnetron sputtering

By Takai O.   Ikuta K.   Inoue Y.  

Thin Solid Films, Vol. 318, Iss. 1, 1998-04 ,pp. : 148-150

Elsevier

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