Author: Shew B.-Y. Huang J.-L. Lii D.-F.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.293, Iss.1, 1997-01, pp. : 212-219
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Oxidation behavior of (Ti 1-x Al( x ))N films prepared by r.f. reactive sputtering
By Inoue S. Uchida H. Koterazawa K. Yoshinaga Y.
Thin Solid Films, Vol. 300, Iss. 1, 1997-05 ,pp. :