Strain relaxation and thermal stability of the 3C-SiC(001)/Si(001) interface: A molecular dynamics study

Author： Chirita V.   Hultman L.   Wallenberg L.R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 47-49

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