Investigation of chemical ordering in MBE-grown Co x Pt 1-x films by X-ray diffraction and high-resolution transmission electron microscopy

By Maret M.   Ulhaq-Bouillet C.   Staiger W.   Cadeville M.C.   Lefebvre S.   Bessiere M.  

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 191-196

Elsevier

Access to resources Recommend Favorite

X-ray diffraction investigation of porous silicon superlattices

By Buttard D.   Bellet D.   Baumbach T.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 69-72

Elsevier

Access to resources Recommend Favorite

Combined high resolution X-ray diffraction and EXAFS studies of Si (1-x) Ge x heterostructures

By De Padova P.   Felici R.   Larciprete R.   Ferrari L.   Ortega L.   Formoso V.   Comin F.   Balerna A.  

Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. : 20-24

Elsevier

Access to resources Recommend Favorite

Crystallization of amorphous Si 0.5 Ge 0.5 films studied by means of in-situ X-ray diffraction and in-situ transmission electron microscopy

By Edelman F.   Raz T.   Komem Y.   Zaumseil P.   Osten H. -J.   Capitan M.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 11, 1999-11 ,pp. : 2617-2628

Taylor & Francis Ltd

Access to resources Recommend Favorite

X-Ray scattering investigation of the interfaces in Si/Si 1-x Ge x superlattices on Si(001) grown by MBE and UHV-CVD

By Baribeau J.-M.   Lafontaine H.  

Thin Solid Films, Vol. 321, Iss. 1, 1998-05 ,pp. : 141-147

Elsevier

Access to resources Recommend Favorite