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Stability and transport properties of microcrystalline Si 1-x Ge x films

By Edelman F.   Raz T.   Komem Y.   Stolzer M.   Werner P.   Zaumseil P.   Osten H.-J.   Griesche J.   Capitan M.  

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Amorphous to polycrystalline transition in Co $\mathsf{_x}$ Si $\mathsf{_{1-x}}$ alloy thin films

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The European Physical Journal B - Condensed Matter, Vol. 41, Iss. 4, 2004-10 ,pp. : 517-524

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In situ characterization of thin Si 1-x Ge x films on Si(100) by spectroscopic ellipsometry

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Quest for an optoelectronic material: tetragonal Si x Ge 1-x films

By Bottomley D.J.   Delaunay J.-J.   Tomita M.   Hayashi T.  

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