Structural and optical characterisation of undoped Si-Si 0.78 Ge 0.22 /Si(001) superlattices grown by MBE

Author: Mironov O.A.   Parker E.H.C.   Phillips P.J.   Dowsett M.G.   Barradas N.P.   Jeynes C.   Mironov M.   Gnezdilov V.P.   Ushakov V.   Eremenko V.V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.306, Iss.2, 1997-09, pp. : 307-312

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Abstract