Structural analysis of 2H-WS 2 thin films by X-ray and TEM investigation

Author: Ennaoui A.   Diesner K.   Fiechter S.   Moser J.H.   Levy F.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.311, Iss.1, 1997-12, pp. : 146-150

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Abstract