Photoelectrochemical properties of copper oxide thin films coated on an n-Si substrate

By Yoon K.H.   Choi W.J.   Kang D.H.  

Thin Solid Films, Vol. 372, Iss. 1, 2000-09 ,pp. : 250-256

Elsevier

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Photovoltaic junction properties of ultrathin films of phthalocyaninatooxovanadium (PcVO) on H-terminated n-Si(111)

By Trombach N.   Tada H.   Hiller S.   Schlettwein D.   Wohrle D.  

Thin Solid Films, Vol. 396, Iss. 1, 2001-09 ,pp. : 109-118

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Measurement of the Metal-Semiconductor Contact Resistance and Control of the Specific Resistance of Semiconductor Films

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Russian Physics Journal, Vol. 46, Iss. 7, 2003-07 ,pp. : 726-735

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Reactively sputtered ternary films of the type TM-Si-N and their properties (TM=early transition metal)

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Vacuum, Vol. 59, Iss. 2, 2000-11 ,pp. : 716-720

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Central metal effect on the organization of porphyrin LB films

By Liu H.-G.   Feng X.-S.   Xue Q.-B.   Wang L.   Yang K.-Z.  

Thin Solid Films, Vol. 340, Iss. 1, 1999-02 ,pp. : 265-270

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