The growth of metallic multilayers on semiconductor substrates and in-situ optical monitoring: the case of Co/Cu on silicon with Pb impurity

Author： Armour P. Emmerson C.M. Shen T.-H. Evans S.D. Rainford B.D.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.318, Iss.1, 1998-04, pp. : 172-176

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