Author： Lagerpusch Ulrike Anczykowski Boris Nembach Eckhard
Publisher： Taylor & Francis Ltd
ISSN： 0141-8610
Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.81, Iss.11, 2001-11, pp. : 2613-2628
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Abstract
It has been explored whether and to what extent atomic force microscopy (AFM) can be used to determine the size and the volume fraction f of fine (diameter far below 1 µm) second-phase particles. A Cu-0.65 at.% Au solid solution strengthened by spherical incoherent SiO2 particles served as a model system; their average radius r was 50 nm. The procedures for correcting the atomic force micrographs for the finite dimensions of the atomic force microscope tip are detailed. So far the error limits in the AFM determination of f and r exceed those which can be reached by transmission electron microscopy (TEM). AFM yields detailed information on those particles which intersect the surfaces of thin TEM foils. This information is indispensable for the evaluation of TEM images but can only be obtained by AFM or with lower accuracy by replica techniques and scanning electron microscopy.
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