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Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. : 133-138

Elsevier

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TEM studies of stress relaxation in GaAsN and GaP thin films

By Li Y.   Weatherly G. C.   Niewczas M.  

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Erratum to ''Formation of the wetting layer in Ge/Si(111) studied by STM and XAFS'' - Thin Solid films 369 (2000) 29-32

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Determination of hydrogen absorption in Pd coated Al thin films

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