Author: Makara V.A. Odarych V.A. Vakulenko O.V. Dacenko O.I.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.342, Iss.1, 1999-03, pp. : 230-237
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
In-situ photoluminescence studies of porous silicon in liquids
By Ozanam F. Chazalviel J.-N. Wehrspohn R.B.
Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. :
Structure and morphological studies of thin porous silicon layers
By Vitanov P. Delibasheva M. Goranova E. Angelov C. Dimov V.
Vacuum, Vol. 58, Iss. 2, 2000-08 ,pp. :
X-ray diffraction studies of porous silicon
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :
XPS and ellipsometric study of DLC/silicon interface
By Zajckova L. Veltruska K. Tsud N. Franta D.
Vacuum, Vol. 61, Iss. 2, 2001-05 ,pp. :