Structural investigation of Si/SiGe superlattices on vicinal (113) oriented Si

Author： Stangl J.   Holy V.   Grim J.   Bauer G.   Zhu J.   Brunner K.   Abstreiter G.   Kienzle O.   Ernst F.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.357, Iss.1, 1999-12, pp. : 71-75

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Self-assembled growth and magnetotransport investigations on strained Si/SiGe multilayers on vicinal (113)-Si surfaces

By Neumann R.   Zhu J.   Brunner K.   Abstreiter G.  

Thin Solid Films, Vol. 380, Iss. 1, 2000-12 ,pp. : 124-126

Elsevier

Access to resources Recommend Favorite

Optical and structural characterization of Si/SiGe heterostructures grown by RTCVD

By Sidiki T.   Christiansen S.H.   Chabert S.   de Boer W.B.   Ferrari C.   Strunk H.P.   Sotomayor Torres C.M.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 431-435

Elsevier

Access to resources Recommend Favorite

Structural and optical characterisation of undoped Si-Si 0.78 Ge 0.22 /Si(001) superlattices grown by MBE

By Mironov O.A.   Parker E.H.C.   Phillips P.J.   Dowsett M.G.   Barradas N.P.   Jeynes C.   Mironov M.   Gnezdilov V.P.   Ushakov V.   Eremenko V.V.  

Thin Solid Films, Vol. 306, Iss. 2, 1997-09 ,pp. : 307-312

Elsevier

Access to resources Recommend Favorite

Optical transitions in Si/Ge superlattices

By Erkoc   Katircioglu  

Thin Solid Films, Vol. 295, Iss. 1, 1997-02 ,pp. : 206-209

Elsevier

Access to resources Recommend Favorite

Optical and structural properties of Si/SiGe wires grown on patterned Si substrates

By Zhuang Y.   Daniel A.   Schelling C.   Schaffler F.   Bauer G.   Grenzer J.   Senz S.  

Thin Solid Films, Vol. 380, Iss. 1, 2000-12 ,pp. : 51-53

Elsevier

Access to resources Recommend Favorite