Electronic structure and energy level alignment of Alq 3 /Al 2 O 3 /Al and Alq 3 /Al interfaces studied by ultraviolet photoemission spectroscopy

Author: Wang K.L.   Lai B.   Lu M.   Zhou X.   Liao L.S.   Ding X.M.   Hou X.Y.   Lee S.T.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.363, Iss.1, 2000-03, pp. : 178-181

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