A novel structure in Ge/Si epilayers grown at low temperature

Author： Cheng H.H.   Chia C.T.   Markov V.A.   Guo X.J.   Chen C.C.   Peng Y.H.   Kuan C.H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 182-184

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