Author: Ishikawa Y. Shibata N. Fukatsu S.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.369, Iss.1, 2000-07, pp. : 213-216
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Low energy Cs + and Cl - ion implantation into Si - SIMS investigations
By Herec J. Sielanko J. Filiks J. Sowa M.
Vacuum, Vol. 63, Iss. 4, 2001-08 ,pp. :