An amorphous SiCOF film with low dielectric constant prepared by plasma-enhanced chemical vapor deposition

Author: Wang P.-F.   Ding S.-J.   Zhang D.W.   Wang J.-T.   Lee W.W.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.385, Iss.1, 2001-04, pp. : 115-119

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Abstract