Radiation induced degradation and surface charging of organic thin films in ultraviolet photoemission spectroscopy

Author: Koch N.   Pop D.   Weber R.L.   Bowering N.   Winter B.   Wick M.   Leising G.   Hertel I.V.   Braun W.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.391, Iss.1, 2001-07, pp. : 81-87

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Abstract