X-Ray diffraction determination of the fractions of hexagonal and twinned phases in cubic GaN layers grown on (001)GaAs substrate

Author： Qu B.   Zheng X.H.   Wang Y.T.   Feng Z.H.   Liu S.A.   Lin S.M.   Yang H.   Liang J.W.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.392, Iss.1, 2001-07, pp. : 29-33

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