In situ monitoring of optical coatings on architectural glass and comparison of the accuracy of the layer thickness attainable with ellipsometry and photometry

Author： Vergohl M.   Malkomes N.   Matthee T.   Brauer G.   Richter U.   Nickol F.-W.   Bruch J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.392, Iss.2, 2001-07, pp. : 258-264

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