Structural evaluation of polycrystalline silicon thin films by hot-wire-assisted PECVD

Author: Feng Y.   Zhu M.   Liu F.   Liu J.   Han H.   Han Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.395, Iss.1, 2001-09, pp. : 213-216

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Abstract