Formation mechanism for TiO x thin film obtained by remote plasma enhanced chemical vapor deposition in H 2 -O 2 mixture gas plasma

Author: Nakamura M.   Kato S.   Aoki T.   Sirghi L.   Hatanaka Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.401, Iss.1, 2001-12, pp. : 138-144

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Abstract