Characterization of -Fe 2 O 3 thin films processed by plasma enhanced chemical vapor deposition (PECVD)

Author: Lee E.-T.   Kim B.-J.   Jang G.-E.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.341, Iss.1, 1999-03, pp. : 73-78

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Abstract