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Elsevier

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Oxidation study of Co/Cu multilayers by resonant X-ray reflectivity

By de Bernabe A.   Capitan M.J.   Fischer H.E.   Lequien S.   Mompean F.J.   Prieto C.   Quiros C.   Colino J.   Lefebvre S.   Bessiere M.   Sanz J.M.  

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The microstructure and X-ray reflectivity of Mo/Si multilayers

By Andreev S.S.   Gaponov S.V.   Gusev S.A.   Haidl M.N.   Kluenkov E.B.   Prokhorov K.A.   Polushkin N.I.   Sadova E.N.   Salashchenko N.N.   Suslov L.A.   Zuev S.Y.  

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Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy

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Thin Solid Films, Vol. 372, Iss. 1, 2000-09 ,pp. : 94-103

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X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films

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