High-quality SiO 2 film deposition using active reaction by oxygen radical

Author: Kumagai A.   Ishibashi K.   Xu G.   Tanaka M.   Nogami H.   Okada O.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.66, Iss.3, 2002-08, pp. : 317-322

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Abstract