Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

Author: Van Noort S.J.T.   Van der Werf K.O.   De Grooth B.G.   Van Hulst N.F.   Greve J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.69, Iss.2, 1997-09, pp. : 117-127

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Abstract