Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy

Author： Coene W.M.J.   Thust A.   de Beeck M.O.   Van Dyck D.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.64, Iss.1, 1996-08, pp. : 109-135

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