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Ultramicroscopy, Vol. 68, Iss. 4, 1997-08 ,pp. : 257-266

Elsevier

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On the resolution of semiconductor multilayers with a scanning electron microscope

By Merli P.G.   Migliori A.   Nacucchi M.   Govoni D.   Mattei G.  

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Backscattered electron contrast on cross sections of interfaces and multilayers in the scanning electron microscope

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Electronic contribution to secondary electron compositional contrast in the scanning electron microscope

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Quantitative phase-sensitive imaging in a transmission electron microscope

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