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Elsevier

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On the resolution of semiconductor multilayers with a scanning electron microscope

By Merli P.G.   Migliori A.   Nacucchi M.   Govoni D.   Mattei G.  

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The phonon contribution to high-resolution electron microscope images

By Boothroyd C.B.   Yeadon M.  

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Use of a general imaging model to achieve predictive autofocus in the scanning electron microscope

By Nicolls F.C.   de Jager G.   Sewell B.T.  

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Beam characteristics for various sizes of annular aperture on scanning electron microscope

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