Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion

Author： Willemsen O.H.   Snel M.M.E.   van Noort S.J.T.   van der Werf K.O.   Grooth B.G.d.G.d.   Figdor C.G.   Greve J.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.80, Iss.2, 1999-10, pp. : 133-144

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