Review of methods for calculating near edge structure

By Rez P.   Bruley J.   Brohan P.   Payne M.   Garvie L.A.J.  

Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. : 159-167

Elsevier

Access to resources Recommend Favorite

Core-hole effects on energy-loss near-edge structure

By Duscher G.   Buczko R.   Pennycook S.J.   Pantelides S.T.  

Ultramicroscopy, Vol. 86, Iss. 3, 2001-02 ,pp. : 355-362

Elsevier

Access to resources Recommend Favorite

Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy

By Lazar S.   Botton G.A.   Wu M.-Y.   Tichelaar F.D.   Zandbergen H.W.  

Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. : 535-546

Elsevier

Access to resources Recommend Favorite

Electron energy-loss spectroscopic profiling of thin film structures: 0.39nm line resolution and 0.04eV precision measurement of near-edge structure shifts at interfaces

By Walther T.  

Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. : 401-411

Elsevier

Access to resources Recommend Favorite

Direct measurement of photoluminescence spatial distribution near the GaAs/AlGaAs quantum well edge using a scanning near-field optical microscope

By Kazantsev D.V.   Gippius N.A.   Oshinowo J.   Forchel A.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 235-241

Elsevier

Access to resources Recommend Favorite