Cross-sectional atomic force microscopy imaging of polycrystalline thin films

Author： Ballif C.   Moutinho H.R.   Hasoon F.S.   Dhere R.G.   Al-Jassim M.M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.85, Iss.2, 2000-10, pp. : 61-71

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