On the resolution of semiconductor multilayers with a scanning electron microscope

By Merli P.G.   Migliori A.   Nacucchi M.   Govoni D.   Mattei G.  

Ultramicroscopy, Vol. 60, Iss. 2, 1995-09 ,pp. : 229-239

Elsevier

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Scanning and transmission electron microscope investigation of preferential thinning during ion beam milling of an Al-Ag alloy containing precipitate plates and the subsequent effects on microanalysis

By Moore K.T.   Howe J.M.   Csontos A.A.  

Ultramicroscopy, Vol. 76, Iss. 4, 1999-04 ,pp. : 195-202

Elsevier

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Backscattered electron contrast on cross sections of interfaces and multilayers in the scanning electron microscope

By Konkol A.   Booker G.R.   Wilshaw P.R.  

Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. : 233-237

Elsevier

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Electronic contribution to secondary electron compositional contrast in the scanning electron microscope

By Castell M.R.   Perovic D.D.   Lafontaine H.  

Ultramicroscopy, Vol. 69, Iss. 4, 1997-10 ,pp. : 279-287

Elsevier

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Use of a general imaging model to achieve predictive autofocus in the scanning electron microscope

By Nicolls F.C.   de Jager G.   Sewell B.T.  

Ultramicroscopy, Vol. 69, Iss. 1, 1997-08 ,pp. : 25-37

Elsevier

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