Improving energy resolution of EELS spectra: an alternative to the monochromator solution

Author： Gloter A. Douiri A. Tence M. Colliex C.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.96, Iss.3, 2003-09, pp. : 385-400

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Towards atomic resolution EELS of anisotropic materials

By Menon N.K. Yuan J.

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 185-205

Elsevier

Access to resources Recommend Favorite

Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis

By Bonnet N. Brun N. Colliex C.

Ultramicroscopy, Vol. 77, Iss. 3, 1999-07 ,pp. : 97-112

Elsevier

Access to resources Recommend Favorite

Multiple solution in maximum entropy deconvolution of high resolution electron microscope images

By Huang D.X. He W.Z. Li F.H.

Ultramicroscopy, Vol. 62, Iss. 3, 1996-02 ,pp. : 141-148

Elsevier

Access to resources Recommend Favorite

Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

By Egerton R.F. Malac M.

Ultramicroscopy, Vol. 92, Iss. 2, 2002-07 ,pp. : 47-56

Elsevier

Access to resources Recommend Favorite

Field emission energy spectra from superconducting and normal states of a niobium tip

By Nagaoka K. Yamashita T. Yamada M. Fujii H. Seo R. Matsuda K. Uchiyama S. Oshima C.

Ultramicroscopy, Vol. 79, Iss. 1, 1999-09 ,pp. : 51-57

Elsevier

Access to resources Recommend Favorite