Multiple solution in maximum entropy deconvolution of high resolution electron microscope images

Author： Huang D.X.   He W.Z.   Li F.H.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.62, Iss.3, 1996-02, pp. : 141-148

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

The phonon contribution to high-resolution electron microscope images

By Boothroyd C.B.   Yeadon M.  

Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. : 361-365

Elsevier

Access to resources Recommend Favorite

Analysis of high resolution transmission electron microscope images of crystalline-amorphous interfaces

By Borgardt N.I.   Plikat B.   Seibt M.   Schroter W.  

Ultramicroscopy, Vol. 90, Iss. 4, 2002-04 ,pp. : 241-258

Elsevier

Access to resources Recommend Favorite

Quantification of high-resolution electron microscope images of amorphous carbon

By Boothroyd C.B.  

Ultramicroscopy, Vol. 83, Iss. 3, 2000-06 ,pp. : 159-168

Elsevier

Access to resources Recommend Favorite

Image deconvolution for defected crystals in field-emission high-resolution electron microscopy

By He W.Z.   Li F.H.   Chen H.   Kawasaki K.   Oikawa T.  

Ultramicroscopy, Vol. 70, Iss. 1, 1997-12 ,pp. : 1-11

Elsevier

Access to resources Recommend Favorite

High-resolution imaging with an aberration-corrected transmission electron microscope

By Lentzen M.   Jahnen B.   Jia C.L.   Thust A.   Tillmann K.   Urban K.  

Ultramicroscopy, Vol. 92, Iss. 3, 2002-08 ,pp. : 233-242

Elsevier

Access to resources Recommend Favorite