An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment

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Journal of Electronic Testing, Vol. 18, Iss. 1, 2002-02 ,pp. : 43-53

Springer Publishing Company

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Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

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Journal of Electronic Testing, Vol. 18, Iss. 2, 2002-04 ,pp. : 159-170

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Isolation of Failing Scan Cells through Convolutional Test Response Compaction

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State and Fault Information for Compaction-Based Test Generation

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Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits

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