Thermal Testing of Analogue Integrated Circuits: A Case Study

By Altet J.  

Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. : 353-357

Springer Publishing Company

Access to resources Recommend Favorite

A design for testability approach for nano-CMOS analogue integrated circuits

By Karmani Mouna   Khedhiri Chiraz   Hamdi Belgacem   Man Ka Lok   Tourki Rached  

International Journal of Electronics, Vol. 100, Iss. 6, 2013-06 ,pp. : 837-850

Taylor & Francis Ltd

Access to resources Recommend Favorite

Efficient fault diagnosis of large scale analogue circuits based on symbolic method

By Wei Tao   Wong Mike W. T.   Lee Y. S.  

International Journal of Electronics, Vol. 86, Iss. 1, 1999-01 ,pp. : 23-33

Taylor & Francis Ltd

Access to resources Recommend Favorite

Design of test stimuli and minimisation of ambiguity in fault diagnosis of analogue circuits with tolerance

By Tan Yanghong  

International Journal of Electronics, Vol. 98, Iss. 2, 2011-02 ,pp. : 173-183

Taylor & Francis Ltd

Access to resources Recommend Favorite

Current-mode programmable synapse circuits for analogue ULSI neural networks

By Al-Ruwaihi Khalid M.  

International Journal of Electronics, Vol. 86, Iss. 2, 1999-02 ,pp. : 189-205

Taylor & Francis Ltd

Access to resources Recommend Favorite