Journal of Electronic Testing,volume 19,issue 1  (02-2014)

Period of time： 2014年1期

Publisher： Springer Publishing Company

Founded in： 1990

Total resources： 50

ISSN： 0923-8174

Subject： TN Radio Electronics, Telecommunications Technology

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Journal of Electronic Testing,volume 19,issue 1

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Editorial

By Agrawal V.D. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 5-5

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Test Technology Technical Council Newsletter

By Ivanov A. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 7-8

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List of Reviewers

By in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 9-10

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Guest Editorial

By Champac V.,Porto I.J. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 11-11

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The ΣΔ-BIST Method Applied to Analog Filters

By Cassol L. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 13-20

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Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard

By Ducoudray-Acevedo G.O. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 21-28

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Topological Considerations for the Diagnosability Conditions of Analogue Circuits Using a Pair of Conjugate Trees

By Hernández-Martínez L. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 29-36

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Multiple Scan Chain Design for Two-Pattern Testing

By Polian I. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 37-48

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A Unified DFT Approach for BIST and External Test

By Flottes M.-L. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 49-60

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A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems

By Vargas F. in (2003)

Journal of Electronic Testing,volume 19,issue 1 , Vol. 19, Iss. 1, 2003-02 , pp. 61-72

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