A Novel Built-In Self-Repair Approach for Embedded RAMs
Author： Lu S-K.
Publisher： Springer Publishing Company
ISSN： 0923-8174
Source： Journal of Electronic Testing, Vol.19, Iss.3, 2003-06, pp. : 315-324
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
