Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours

Author： Rodríguez-Montañés R. Muñoz D. Balado L. Figueras J.

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.20, Iss.2, 2004-04, pp. : 143-153

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