Period of time: 2014年2期
Publisher: Springer Publishing Company
Founded in: 1990
Total resources: 50
ISSN: 0923-8174
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electronic Testing,volume 20,issue 2
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By Agrawal Vishwani D. in (2004)
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.Test Technology Technical Council Newsletter
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled Oscillators
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours
By Rodríguez-Montañés R.,Muñoz D.,Balado L.,Figueras J. in (2004)
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.Testability Trade-Offs for BIST Data Paths
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.Scalable Delay Fault BIST for Use with Low-Cost ATE
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.Scan Latch Design for Test Applications
Journal of Electronic Testing,volume 20,issue 2 , Vol. 20, Iss. 2, 2004-04 , pp.