Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption

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Journal of Electronic Testing, Vol. 18, Iss. 1, 2002-02 ,pp. : 55-62

Springer Publishing Company

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Model for Transient Fault Susceptibility of Combinational Circuits: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

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Statistical analysis of multiple intermittent faults in combinational circuits

By Abd-El-Barr Mostafa H.   Ansari Shad I.  

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Design Error Diagnosis with Re-Synthesis in Combinational Circuits

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Experimental Results for Self-Dual Multi-Output Combinational Circuits

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