Author: Saposhnikov V.V.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.14, Iss.3, 1999-06, pp. : 295-300
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Theorems for Fault Collapsing in Combinational Circuits
Journal of Electronic Testing, Vol. 22, Iss. 1, 2006-02 ,pp. :
Design Error Diagnosis with Re-Synthesis in Combinational Circuits
By Ubar R.
Journal of Electronic Testing, Vol. 19, Iss. 1, 2003-02 ,pp. :